Nanoscience Scanning Electron Microscope (SEM)

A scanning electron microscope (SEM) is a powerful scientific instrument used for high-resolution imaging and surface elemental analysis. They work by scanning a focused beam of electrons across the sample’s surface and detecting the resulting signals to create detailed images. SEMs provide value in a wide range of applications including materials science, biology, nanotechnology, forensics, geology, quality control, failure analysis, and particle analysis.